With the fast proliferation of digital cameras and other image acquisition devices due to the advancement in digital photography technology, photos from the public may have good news values for making journalist reports. However, one big challenge is how to authenticate the visual contents from the public, which may come from unreliable sources. Can we trust what we see in a photo?
In this talk, Prof. Alex Kot will show different types of manipulated images videos and deepfake. A large variety of forensics works have been proposed to detect these manipulated images and videos based on different types of tell-tale signs. Several techniques in detecting such manipulations will be introduced. These techniques help expose common image forgeries, especially those easy-to-make forgeries, which can be hardly seen directly by human eyes.
Prof. Alex Kot has been with the Nanyang Technological University, Singapore since 1991. He headed the Division of Information Engineering for eight years before serving as the Vice Dean (Research) for the School of Electrical and Electronic Engineering. Subsequently, he was appointed as Associate Dean for College of Engineering for eight years. Currently, he is Director of Rapid-Rich Object Search (ROSE) Lab and Director, NTU-PKU JRI. He published extensively in the areas of signal processing for communication, biometrics, information forensics and security and computer vision. Dr. Kot served as Associate Editor for several IEEE Transactions, including Signal Processing, Image Processing, Multimedia, Signal Processing Letters, Signal Processing Magazine, Video Technology, and Information Forensics and Security. Dr. Kot served the IEEE SP Society in various capacities such as the General Co-Chair for the 2004 IEEE International Conference on Image Processing (ICIP), IEEE Fellow Evaluation Committee member, the Vice-President for the IEEE Signal Processing Society, and member of IEEE SPS Board of Governors. He was IEEE Distinguished Lecturer for SP Society and C&S Society. He is now a Fellow of IEEE and a Fellow of Academy of Engineering, Singapore